FY2019

1. "Disorder and Weak Localization near Charge Neutral Point in Ti-cleaned Single-Layer Graphene", A. Fujimoto, C. J. Perini, D. Terasawa, A. Fukuda, Y. Harada, S. Sasa, M. Yano, and E. M. Vogel, Physica Status Solidi (B) 256 1800541 (2019 Jun).
2. "The thermal stability of ϵ-Ga₂O₃ thin films grown on (111) 3C-SiC template substrates", M. Koyama, T. Kaneko, S. Fujiwara, T. Maemoto, and S. Sasa, Compound Semiconductor Week, CSW 2019 8819218 (2019 Jun).
3. "溶液塗布熱分解法で作製したHf0.5Zr0.5O2薄膜の特性評価", 矢野 満明, 井上 泰一, 大田 宗司, 河本 泰輝, 広藤 裕一, 小山 政俊, 小池 一歩, 材料 68 (10) 745 - 750 (2019 Oct).